Simple Testing Can Prevent Most Critical Failures: An Analysis of Production Failures in Distributed Data-intensive Systems
In this reference
Ding Yuan, Yu Luo, Xin Zhuang, and others: Simple Testing Can Prevent Most Critical Failures: An Analysis of Production Failures in Distributed Data-intensive Systems.
Cite the original work
Ding Yuan & Yu Luo & Xin Zhuang & Guilherme Renna Rodrigues & Xu Zhao & Yongle Zhang & Pranay U. Jain & Michael Stumm. Simple Testing Can Prevent Most Critical Failures: An Analysis of Production Failures in Distributed Data-intensive Systems [Research paper]. USENIX. https://www.usenix.org/system/files/conference/osdi14/osdi14-paper-yuan.pdf
View BibTeX
@misc{simple_testing_can_prevent_most_critical_failures_an_analysis_of_production_failures_in_di,
author = {Ding Yuan and Yu Luo and Xin Zhuang and Guilherme Renna Rodrigues and Xu Zhao and Yongle Zhang and Pranay U. Jain and Michael Stumm},
title = {{Simple Testing Can Prevent Most Critical Failures: An Analysis of Production Failures in Distributed Data-intensive Systems}},
howpublished = {USENIX},
url = {https://www.usenix.org/system/files/conference/osdi14/osdi14-paper-yuan.pdf}
}
